Invention Grant
US08212899B2 Imaging apparatus capable of highly accurate defective pixel correction processing
有权
能够进行高精度的缺陷像素校正处理的成像装置
- Patent Title: Imaging apparatus capable of highly accurate defective pixel correction processing
- Patent Title (中): 能够进行高精度的缺陷像素校正处理的成像装置
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Application No.: US12109093Application Date: 2008-04-24
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Publication No.: US08212899B2Publication Date: 2012-07-03
- Inventor: Yoshitaka Egawa
- Applicant: Yoshitaka Egawa
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-119929 20070427
- Main IPC: H04N9/64
- IPC: H04N9/64 ; H04N5/217

Abstract:
There is provided an imaging apparatus which uses a defect correction circuit to perform predetermined signal processing with respect to image signals output from an imaging section in which a plurality of pixels each formed of a photoelectric transducer with a color filter provided thereon are two-dimensionally arranged. The defect correction circuit includes a pattern extraction circuit which extracts image pattern information based on a signal of an adjacent pixel that is adjacent to a judgment target pixel and signals of peripheral pixels that are close to the adjacent pixel and have the same color as the adjacent pixel in the image signals, and a substitution circuit which substitutes a signal of the judgment target pixel by signals of peripheral pixels that are close to the judgment target pixel and have the same color as the judgment target pixel.
Public/Granted literature
- US20080266428A1 IMAGING APPARATUS CAPABLE OF HIGHLY ACCURATE DEFECTIVE PIXEL CORRECTION PROCESSING Public/Granted day:2008-10-30
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