Invention Grant
- Patent Title: Method and apparatus for surveying actual measurement data of a component
- Patent Title (中): 测量部件实际测量数据的方法和装置
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Application No.: US12220242Application Date: 2008-07-23
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Publication No.: US08212993B2Publication Date: 2012-07-03
- Inventor: Matthia Prams , Michael Gandyra , Roman Apanovich
- Applicant: Matthia Prams , Michael Gandyra , Roman Apanovich
- Applicant Address: DE Neubeuern
- Assignee: Steinbichler Optotechnik GmbH
- Current Assignee: Steinbichler Optotechnik GmbH
- Current Assignee Address: DE Neubeuern
- Agency: Dilworth & Barrese, LLP.
- Priority: DE102007034168 20070723
- Main IPC: G01C3/08
- IPC: G01C3/08
Abstract:
An improved method for surveying actual measurement data of a component, which originate from an optical scan, is characterized in that the actual measurement data (2) of the component (1) are surveyed by means of a measurement program (24) for a tactile coordinate measuring instrument, wherein the measurement program (24) generates a virtual measuring stylus of a virtual coordinate measuring instrument, which surveys the actual measurement data of the component.
Public/Granted literature
- US20090063093A1 Method and apparatus for surveying actual measurement data of a component Public/Granted day:2009-03-05
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