Invention Grant
- Patent Title: Microparticles measuring apparatus
- Patent Title (中): 微粒测量仪
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Application No.: US12780376Application Date: 2010-05-14
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Publication No.: US08213009B2Publication Date: 2012-07-03
- Inventor: Yosuke Muraki , Masaya Kakuta
- Applicant: Yosuke Muraki , Masaya Kakuta
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JPP2009-123039 20090521
- Main IPC: G01N15/02
- IPC: G01N15/02

Abstract:
Disclosed herein is a microparticles measuring apparatus including: an optical detecting section configured to direct a laser beam toward microparticles passing through a flow channel, detect light emanating from the microparticles, and convert the detected light into electrical signals; and a controlling unit configured to calculate the speed of the microparticles passing through the flow channel according to the electrical signals and suspend the supply of solution containing the microparticles when the calculated speed exceeds a prescribed limit.
Public/Granted literature
- US20110069310A1 MICROPARTICLES MEASURING APPARATUS Public/Granted day:2011-03-24
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