Invention Grant
US08213569B2 X-ray diagnosis apparatus and a method for controlling an X-ray irradiation region
有权
X射线诊断装置和X射线照射区域的控制方法
- Patent Title: X-ray diagnosis apparatus and a method for controlling an X-ray irradiation region
- Patent Title (中): X射线诊断装置和X射线照射区域的控制方法
-
Application No.: US12836169Application Date: 2010-07-14
-
Publication No.: US08213569B2Publication Date: 2012-07-03
- Inventor: Ryuji Zaiki , Reiko Hashimoto
- Applicant: Ryuji Zaiki , Reiko Hashimoto
- Applicant Address: JP Tokyo JP Otawara-shi
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee Address: JP Tokyo JP Otawara-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPP2009-166071 20090714
- Main IPC: G21K1/12
- IPC: G21K1/12 ; G21K1/04

Abstract:
An X-ray diagnosis apparatus and a method for controlling an X-ray irradiation region that can appropriately narrow down an X-ray radiation aperture so as to fit a configuration of a region of interest during acquisition of X-ray projection data for reconstructing tomography images of an object.Based on a plurality of 2D image data acquired through a preliminarily X-ray imaging, a 3D region of interest is set up on an examination target portion having a strong directionality. X-ray imaging of the 3D region of interest is performed by sliding and rotating a plurality of aperture blades in an X-ray collimator based on a projected figure of the 3D region of interest along successively renewed imaging directions around a periphery of an object.
Public/Granted literature
- US20110013742A1 X-RAY DIAGNOSIS APPARATUS AND A METHOD FOR CONTROLLING AN X-RAY IRRADIATION REGION Public/Granted day:2011-01-20
Information query