Invention Grant
- Patent Title: X-ray security inspection machine
- Patent Title (中): X光检查机
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Application No.: US12715463Application Date: 2010-03-02
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Publication No.: US08213570B2Publication Date: 2012-07-03
- Inventor: Baljinder Singh Panesar , Douglas R. Gillard-Hickman
- Applicant: Baljinder Singh Panesar , Douglas R. Gillard-Hickman
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
X-ray security inspection machine (10) comprising an X-ray tunnel (40); a conveyor means (50) for conveying an article through the tunnel; an X-ray source for irradiating the article; and an X-ray detection means for detecting X-rays transmitted through the article. In one aspect, the detection means comprises a photodetector array module (20) actuatable between a first stowed configuration and a second deployed configuration. In a second aspect, the detection means comprises a first unit having a first photodetector array (22); and a second unit, having a second photodetector array (24), offset with respect to the first unit. The units are moveable relative to one another between a first arrangement where the arrays overlap to a first degree and a second arrangement where they overlap to a second, lower degree; preferably zero. Also, a conveyor belt-tracking device (100) comprising a guide frame (104) to receive the conveyor belt (116) and substantially to restrict its motion to a predetermined direction.
Public/Granted literature
- US20100254511A1 X-Ray Security Inspection Machine Public/Granted day:2010-10-07
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