Invention Grant
- Patent Title: Inspection apparatus method and apparatus comprising motion responsive control
- Patent Title (中): 包括运动响应控制的检查装置方法和装置
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Application No.: US11642344Application Date: 2006-12-20
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Publication No.: US08213676B2Publication Date: 2012-07-03
- Inventor: Clark A. Bendall
- Applicant: Clark A. Bendall
- Applicant Address: US NY Schenectady
- Assignee: GE Inspection Technologies LP
- Current Assignee: GE Inspection Technologies LP
- Current Assignee Address: US NY Schenectady
- Agency: GE Global Patent Operation
- Agent Mark A. Conklin
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
An inspection apparatus can process image data of one or more frames. In one aspect processing of image data can include processing for determination of a motion parameter. In one aspect an inspection apparatus can be controlled responsively to the processing of image data for determination of a motion parameter.
Public/Granted literature
- US20080152210A1 Inspection apparatus method and apparatus comprising motion responsive control Public/Granted day:2008-06-26
Information query
