Invention Grant
US08214158B2 X-ray imaging apparatus, X-ray imaging method and method of controlling X-ray imaging apparatus
有权
X射线成像装置,X射线成像方法和X射线成像装置的控制方法
- Patent Title: X-ray imaging apparatus, X-ray imaging method and method of controlling X-ray imaging apparatus
- Patent Title (中): X射线成像装置,X射线成像方法和X射线成像装置的控制方法
-
Application No.: US12526418Application Date: 2009-03-11
-
Publication No.: US08214158B2Publication Date: 2012-07-03
- Inventor: Taihei Mukaide , Kazuhiro Takada , Masatoshi Watanabe
- Applicant: Taihei Mukaide , Kazuhiro Takada , Masatoshi Watanabe
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2008-062788 20080312
- International Application: PCT/JP2009/055215 WO 20090311
- International Announcement: WO2009/113713 WO 20090917
- Main IPC: G01N31/00
- IPC: G01N31/00

Abstract:
A simplified X-ray imaging apparatus is capable of computationally determining effective atomic numbers with small error factors even for light elements. In one embodiment, the X-ray imaging apparatus has an X-ray generation unit 101 (400) for generating X-rays and a detector 105 (405) for detecting X-rays transmitted through an object of examination 104 (403). A computing unit 106 (406) computationally determines a quantity of an X-ray phase attributable to the object of examination and an X-ray transmittance of the object of examination from data detected by the detector. The computing unit also computationally determines an effective atomic number of the object of examination from ρet determined from the quantity of the X-ray phase and μt determined from the X-ray transmittance.
Public/Granted literature
- US20100318302A1 X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD AND METHOD OF CONTROLLING X-RAY IMAGING APPARATUS Public/Granted day:2010-12-16
Information query