Invention Grant
- Patent Title: Estimation of non-equibiaxial stress using instrumented indentation technique
- Patent Title (中): 使用仪器压痕技术估算非等轴应力
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Application No.: US12526166Application Date: 2007-02-06
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Publication No.: US08214162B2Publication Date: 2012-07-03
- Inventor: Jae Hwan Han
- Applicant: Jae Hwan Han
- Applicant Address: KR
- Assignee: Frontics, Inc.
- Current Assignee: Frontics, Inc.
- Current Assignee Address: KR
- Agency: Harness, Dickey & Pierce, P.L.C.
- International Application: PCT/KR2007/000621 WO 20070206
- International Announcement: WO2008/096914 WO 20080814
- Main IPC: G01N3/08
- IPC: G01N3/08

Abstract:
Method for evaluating an asymmetric residual stress for a material by the indentation test comprises applying the residual stresses with an uniaxial and an symmetrical biaxial tensions on the material and then performing an instrumented indentation test indenting an asymmetric indenter on the material; and comparing a slope of indentation load-depth curve when the long diagonal direction of the asymmetric indenter is perpendicular to the direction of the largest residual stress with that in stress-free state, and then a slope of indentation load-depth curve when the long diagonal direction of the asymmetric indenter is parallel to the direction of the largest residual stress with that in stress-free state, so as to evaluate the asymmetric residual stress for the material.
Public/Granted literature
- US20100198530A1 ESTIMATION OF NON-EQUIBIAXIAL STRESS USING INSTRUMENTED INDENTATION TECHNIQUE Public/Granted day:2010-08-05
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