Invention Grant
US08214166B2 Method and its system for calibrating measured data between different measuring tools
有权
用于校准不同测量工具之间测量数据的方法及其系统
- Patent Title: Method and its system for calibrating measured data between different measuring tools
- Patent Title (中): 用于校准不同测量工具之间测量数据的方法及其系统
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Application No.: US12137779Application Date: 2008-06-12
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Publication No.: US08214166B2Publication Date: 2012-07-03
- Inventor: Maki Tanaka , Wataru Nagatomo
- Applicant: Maki Tanaka , Wataru Nagatomo
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2007-158621 20070615
- Main IPC: G01P21/00
- IPC: G01P21/00

Abstract:
A method, and a corresponding system, are provided for calibrating data of an object measured by different measuring tools, including measuring a Critical-Dimension (CD) and roughness of an object by using a CD-SEM tool, calculating a number of cross section measurement points required for calibration, by statistically processing the roughness of the object, measuring the cross section of the object by using a cross section measuring tool to obtain cross section data at the calculated number of cross section measurement points, calculating the average measurement of the cross section measurement height, and calculating a calibration correction value that is a function of a difference between the average CD measurement of the object and the average measurement of the cross section measurement height of the object.
Public/Granted literature
- US20080319696A1 Method and Its System for Calibrating Measured Data Between Different Measuring Tools Public/Granted day:2008-12-25
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