Invention Grant
US08214304B2 Method and device for calculating a similarity metric between a first feature vector and a second feature vector
有权
用于计算第一特征向量和第二特征向量之间的相似性度量的方法和装置
- Patent Title: Method and device for calculating a similarity metric between a first feature vector and a second feature vector
- Patent Title (中): 用于计算第一特征向量和第二特征向量之间的相似性度量的方法和装置
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Application No.: US12090360Application Date: 2006-10-16
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Publication No.: US08214304B2Publication Date: 2012-07-03
- Inventor: Martin Franciscus McKinney , Dirk Jeroen Breebaart
- Applicant: Martin Franciscus McKinney , Dirk Jeroen Breebaart
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP05109636 20051017
- International Application: PCT/IB2006/053788 WO 20061016
- International Announcement: WO2007/046049 WO 20070426
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
The method of calculating a similarity metric between a first feature vector of a first audio and/or video signal and a second feature vector of a second audio and/or video signal of the invention comprises the step of calculating a distance between the first feature vector and the second feature vector, both the first feature vector and the second feature vector comprising a feature value of a second dimension, wherein a weighting factor is used that gives a stronger weight to the first dimension than to the second dimension. The electronic device of the invention comprises electronic circuitry, which is operative to perform the method of the invention. The software of the invention makes a programmable device operative to perform the method of the invention.
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