Methods and apparatuses are disclosed for testing multicore processors. In some embodiments, the tested multicore processor may include at least a first core and a second core, a data input coupled to a first scan chain in the first core and a second scan chain in the second core, and a multiplexer including at least a first input and a second input, the first input coupled with a data output of the first scan chain and the second input coupled with a data output of the second scan chain, the multiplexer further including an output that couples to one or more pins on a package of the processor, the multiplexer further including a select signal that couples to the one or more pins on the package of the processor, and wherein the data input couples to the one or more pins on the package of the processor.