Invention Grant
US08214798B2 Automatic calculation of orthogonal defect classification (ODC) fields
失效
自动计算正交缺陷分类（ODC）领域
- Patent Title: Automatic calculation of orthogonal defect classification (ODC) fields
- Patent Title (中): 自动计算正交缺陷分类（ODC）领域
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Application No.: US12174585Application Date: 2008-07-16
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Publication No.: US08214798B2Publication Date: 2012-07-03
- Inventor: Silvia Bellucci , Bruno Portaluri
- Applicant: Silvia Bellucci , Bruno Portaluri
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Stephen J. Walder, Jr.; Jeffrey S. LaBaw
- Main IPC: G06F9/45
- IPC: G06F9/45
Abstract:
Mechanisms for Orthogonal Defect Classification (ODC) analysis in a computing system are provided. One implementation involves determining a defect in a software application, providing a defect fix to the software application, linking the source code fix to the defect, and automatically performing ODC analysis and calculating ODC information based on calculations against the source code linked to the defect fixed.
Public/Granted literature
- US20100017787A1 SYSTEM AND PROCESS FOR AUTOMATIC CALCULATION OF ORTHOGONAL DEFECT CLASSIFICATION (ODC) FIELDS Public/Granted day:2010-01-21
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