Invention Grant
- Patent Title: Program testing method and testing device
- Patent Title (中): 程序测试方法和测试设备
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Application No.: US11642793Application Date: 2006-12-20
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Publication No.: US08214803B2Publication Date: 2012-07-03
- Inventor: Hiroshi Horii , Hisashi Miyashita , Hideki Tai
- Applicant: Hiroshi Horii , Hisashi Miyashita , Hideki Tai
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent William Stock; Anne Vachon Dougherty
- Priority: JP2005-368746 20051221
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
A testing device for testing a system configured of an application and a set of execution-environment-dependent resources used by the application includes a DI container for injecting one resource set (EUT) into an application for which a test is executed via an application interface, the resource set being a candidate of dependency injection into the application, and a test execution unit that executes a test on the application with the one resource set having been injected therein. When another resource set that is different from the one resource set exists the injection by the DI container and the test by the test execution unit are executed on the other resource set.
Public/Granted literature
- US20070198970A1 Program testing method and testing device Public/Granted day:2007-08-23
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