Invention Grant
- Patent Title: Adhering matter inspection equipment and method for inspecting adhering method
- Patent Title (中): 附着物检查设备及检验方法
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Application No.: US11908516Application Date: 2005-03-14
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Publication No.: US08217339B2Publication Date: 2012-07-10
- Inventor: Hideo Kashima , Yasuaki Takada , Izumi Waki
- Applicant: Hideo Kashima , Yasuaki Takada , Izumi Waki
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- International Application: PCT/JP2005/004461 WO 20050314
- International Announcement: WO2006/097990 WO 20060921
- Main IPC: H01J49/26
- IPC: H01J49/26 ; G01N30/72

Abstract:
A technology for collecting a granular substance adhering to a baggage with high rate without touching the substance and inspecting whether a dangerous or specific sample material is adhered to the baggage. A method for simplifying or automating such an inspection is also provided. An adhering matter inspection equipment (1) is characterized in that the equipment comprises a collecting section (5) for collecting a sample material peeled off from an inspection object (25) whereupon the sample material is adhered by blowing compression gas through a capturing filter (52), and an inspecting section (2) for analyzing the sample material captured by the capturing filter (52), and further characterized in that the inspection equipment comprises a section (3) for delivering a baggage to the inspecting section (2), and a carrying section (4) for carrying the capturing filter (52) from the capturing section (5) to the inspecting section (2).
Public/Granted literature
- US20090200458A1 Adhering Matter Inspection Equipment and Method for Inspecting Adhering Matter Public/Granted day:2009-08-13
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