Invention Grant
- Patent Title: Particle beam irradiation apparatus
- Patent Title (中): 粒子束照射装置
-
Application No.: US12989767Application Date: 2009-06-09
-
Publication No.: US08217364B2Publication Date: 2012-07-10
- Inventor: Takaaki Iwata
- Applicant: Takaaki Iwata
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- International Application: PCT/JP2009/060530 WO 20090609
- International Announcement: WO2010/143266 WO 20101216
- Main IPC: G21K5/04
- IPC: G21K5/04

Abstract:
A particle beam irradiation apparatus which can perform high-precision beam irradiation position is obtained. The apparatus is provided with inverse mapping means having an inverse mapping mathematical expression model for generating an command value for the scanning electromagnet and an command value for kinetic energy of the charged particle beam from a desired irradiation position coordinate of the charged particle beam in an irradiation subject so that irradiation to the irradiation subject is implemented on the basis of the command values concerned, and the scanning electromagnet and the kinetic energy of the charged particle beam are controlled on the basis of the command values generated from the desired irradiation position coordinate of the charged particle beam in the irradiation subject by using the inverse mapping mathematical expression model, thereby irradiating the irradiation subject with the charged particle beam while scanning the charged particle beam.
Public/Granted literature
- US20110174994A1 PARTICLE BEAM IRRADIATION APPARATUS Public/Granted day:2011-07-21
Information query