Invention Grant
- Patent Title: Measuring agglutination parameters
- Patent Title (中): 测量凝集参数
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Application No.: US12518895Application Date: 2007-12-18
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Publication No.: US08217647B2Publication Date: 2012-07-10
- Inventor: Wendy Uyen Dittmer , Peggy De Kievit , Jeroen Hans Nieuwenhuis , Menno Willem Jose Prins , Leonardus Josephus Van Ijzendoorn , Xander Jozef Antoine Janssen
- Applicant: Wendy Uyen Dittmer , Peggy De Kievit , Jeroen Hans Nieuwenhuis , Menno Willem Jose Prins , Leonardus Josephus Van Ijzendoorn , Xander Jozef Antoine Janssen
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP06126507 20061219; EP07116951 20070921
- International Application: PCT/IB2007/055195 WO 20071218
- International Announcement: WO2008/075285 WO 20080626
- Main IPC: G01R33/00
- IPC: G01R33/00 ; G01N33/553

Abstract:
A method and system for measuring agglutination in a target-induced agglutination assay with one or more magnetic particles is performed in a reaction chamber. After the magnetic particles, which are capable of binding to a target are provided in the assay, an agglutination process is performed resulting in agglutinated particles. Further an alternating current magnetic field (HAC) is applied to the assay. The method further includes measuring an effect of the HAC on the one or more magnetic particles unattached to any surface. The measured effect is indicative of one or more agglutination parameters.
Public/Granted literature
- US20100033158A1 MEASURING AGGLUTINATION PARAMETERS Public/Granted day:2010-02-11
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