Invention Grant
- Patent Title: Open terminal detection device and semiconductor device
- Patent Title (中): 开放式终端检测装置及半导体装置
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Application No.: US12683752Application Date: 2010-01-07
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Publication No.: US08217660B2Publication Date: 2012-07-10
- Inventor: Hideo Yamawaki
- Applicant: Hideo Yamawaki
- Applicant Address: JP Toyota
- Assignee: Toyota Jidosha Kabushiki Kaisha
- Current Assignee: Toyota Jidosha Kabushiki Kaisha
- Current Assignee Address: JP Toyota
- Agency: Oliff & Berridge, PLC
- Priority: JP2009-032685 20090216
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
An open terminal detection device that detects an open terminal, including: a transistor that is supplied with a base current from a current source in which an amount of current supply decreases corresponding to an increase in an external impedance of the terminal; a diode that limits discharge of a base charge of the transistor; and an output circuit that outputs an output signal in coordination with on/off switching of the transistor.
Public/Granted literature
- US20100207639A1 OPEN TERMINAL DETECTION DEVICE AND SEMICONDUCTOR DEVICE Public/Granted day:2010-08-19
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