Invention Grant
- Patent Title: Test apparatus, test method, and manufacturing method
- Patent Title (中): 试验装置,试验方法和制造方法
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Application No.: US12469857Application Date: 2009-05-21
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Publication No.: US08217672B2Publication Date: 2012-07-10
- Inventor: Kazuhiro Sato , Manabu Kai
- Applicant: Kazuhiro Sato , Manabu Kai
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2006-322947 20061130
- Main IPC: G01R31/312
- IPC: G01R31/312

Abstract:
An apparatus includes: a strip line cell 100 having a first conductor board that has the width larger than the width of RFID tag T1 that receives a predetermined radio wave signal and reacts, to which first conductor board an electric signal that corresponds to the radio wave signal is supplied from outside, and a second conductor board opposed to the first conductor board, wherein the RFID tag T1 is arranged on other side with the opposite side opposed to the second conductor board, of the first conductor board that transmits the radio wave signal with an output according to an electric power that the electric signal possesses; a reader writer 20 that supplies the electric signal to the first conductor board of the strip line cell 100; and a computer 30 that confirms presence of reaction in the RFID tag T1.
Public/Granted literature
- US20090224778A1 TEST APPARATUS, TEST METHOD, AND MANUFACTURING METHOD Public/Granted day:2009-09-10
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