Invention Grant
- Patent Title: Method and circuit for testing integrated circuit
- Patent Title (中): 集成电路测试方法和电路
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Application No.: US12552288Application Date: 2009-09-02
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Publication No.: US08217673B2Publication Date: 2012-07-10
- Inventor: Hiroyuki Kimura
- Applicant: Hiroyuki Kimura
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Charles Bergere
- Main IPC: G01R31/10
- IPC: G01R31/10
Abstract:
A test controller switches the operation of output stages in an integrated circuit between a normal operation mode and a test mode. The output stages are respectively connected to switch elements. A level shifter generates a switch signal for controlling activation and deactivation of the switch elements in accordance with the normal operation mode and the test mode.
Public/Granted literature
- US20110050272A1 METHOD AND CIRCUIT FOR TESTING INTEGRATED CIRCUIT Public/Granted day:2011-03-03
Information query
