Invention Grant
- Patent Title: Phase-detector for detecting phase difference of [PI]2N
- Patent Title (中): 用于检测[PI] 2N相位差的相位检测器
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Application No.: US13060914Application Date: 2009-08-25
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Publication No.: US08217683B2Publication Date: 2012-07-10
- Inventor: Yann Le Guillou
- Applicant: Yann Le Guillou
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP08290802 20080827
- International Application: PCT/IB2009/053733 WO 20090825
- International Announcement: WO2010/023627 WO 20100304
- Main IPC: H03D13/00
- IPC: H03D13/00
![Phase-detector for detecting phase difference of [PI]2N](/abs-image/US/2012/07/10/US08217683B2/abs.jpg.150x150.jpg)
Abstract:
A basic symmetric Π/2 phase-detector receives four control signals that control a differential current at the detector's output. Each respective control signal is a linear combination of a respective pair of signals chosen from a first input signal, its logic complement, a second input signal and the logic complement of the latter. Operation is based on time-averaging the differential current, the result being zero at a phase difference of Π/2. By means of adding one or more additional current sources to the output, controlled by one or more of the control signals, the basic operation is skewed. The time-averaged output current is now made zero only at a value of the phase difference different from Π/2. In an embodiment with uniform current sources and resistors, the modified detector is configured for a phase difference of Π/2N .
Public/Granted literature
- US20110148467A1 PHASE-DETECTOR FOR DETECTING PHASE DIFFERENCE OF [PI]2N Public/Granted day:2011-06-23
Information query
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