Invention Grant
- Patent Title: Fast measurement initialization for memory
- Patent Title (中): 内存快速测量初始化
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Application No.: US13088946Application Date: 2011-04-18
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Publication No.: US08217695B2Publication Date: 2012-07-10
- Inventor: Yantao Ma
- Applicant: Yantao Ma
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Knobbe Martens Olson & Bear, LLP
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
Systems and methods for synchronization of clock signals are disclosed. In a feedback system such as a delay-lock loop circuit, delays to be applied can be determined adaptively based on a phase difference between a reference signal and a clock signal being delayed. Such adaptive decisions can be made during each feedback cycle, thereby making it possible to achieve a phase lock faster and more efficiently. In some embodiments, such adaptive functionality can be incorporated into existing circuits with minimal impact.
Public/Granted literature
- US20110193603A1 FAST MEASUREMENT INITIALIZATION FOR MEMORY Public/Granted day:2011-08-11
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