Invention Grant
- Patent Title: Fault tolerant redundant clock circuit
- Patent Title (中): 容错冗余时钟电路
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Application No.: US12620454Application Date: 2009-11-17
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Publication No.: US08217697B2Publication Date: 2012-07-10
- Inventor: Harold William Satterfield
- Applicant: Harold William Satterfield
- Applicant Address: US CA Milpitas
- Assignee: Intersil Americas Inc.
- Current Assignee: Intersil Americas Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Fogg & Powers LLC
- Main IPC: H03K3/027
- IPC: H03K3/027 ; H03K3/013

Abstract:
A clock generation circuit, includes, in part, a comparator, a logic unit, and a switching circuit. The switching circuit generates a signal that is applied to the comparator. If the input voltage level of the signal applied to the comparator is greater than a first reference voltage, the comparator asserts its first output signals. If the input voltage level of the signal applied to the comparator is less than a second reference voltage, the comparator asserts its second output signal. The output signals of the comparator form a first pair of feedback signals applied to the switching circuit. The logic unit responds to the output signals of the comparator to generate a second pair of oscillating feedback signals that are also applied to the switching circuit. The switching circuit varies a capacitor voltage in response to a reference current and in response to the two pairs of feedback signals it receives.
Public/Granted literature
- US20100127679A1 FAULT TOLERANT REDUNDANT CLOCK CIRCUIT Public/Granted day:2010-05-27
Information query
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