A temperature sensor performs more precise temperature measurement, even when manufacturing fluctuations are present in semiconductor elements forming a circuit for generating a temperature-dependent current. The temperature sensor includes: a temperature-dependent voltage generation circuit for generating a temperature-dependent potential that is dependent on temperature; a current generation circuit for allowing a temperature-dependent current to flow based on the temperature-dependent potential; a reference current generation circuit for generating a reference current that is independent of temperature; a capacitor that is charged alternately with the temperature-dependent current during a first charge period and the reference current during a second charge period; a pulse generation circuit for comparing a charged voltage of the capacitor with a reference voltage to generate a pulse; and a control circuit for alternately supplying the temperature-dependent current and the reference current to the capacitor. The temperature-dependent voltage generation circuit includes switches for switching connection relations between MOS transistors forming a current source circuit included in the temperature-dependent voltage generation circuit and bipolar transistors each serving as a load of the current source circuit.