Invention Grant
- Patent Title: Particle measuring device and particle size measure device
- Patent Title (中): 粒子测量装置和粒度测量装置
-
Application No.: US12595348Application Date: 2008-04-08
-
Publication No.: US08218132B2Publication Date: 2012-07-10
- Inventor: Yukio Yamada , Shinpei Okawa , Taisuke Hirono
- Applicant: Yukio Yamada , Shinpei Okawa , Taisuke Hirono
- Applicant Address: JP Tokyo JP Aichi
- Assignee: The University of Electro-Communications,Kowa Company, Ltd.
- Current Assignee: The University of Electro-Communications,Kowa Company, Ltd.
- Current Assignee Address: JP Tokyo JP Aichi
- Agency: Duane Morris LLP
- Priority: JP2007-104901 20070412; JP2007-104931 20070412
- International Application: PCT/JP2008/056939 WO 20080408
- International Announcement: WO2008/132995 WO 20081106
- Main IPC: G01P3/36
- IPC: G01P3/36
Abstract:
Particles flowed through a micro-channel are imaged by imaging means. Particle speed measuring means determines the particle speed from the image data. Particle counting means counts the particles flowed for a predetermined time. Particle size measuring means measures the size of the particles. The measurements of the particles flowed at a predetermined timing are managed by data associating means. With this, the speed, number and size of particles flowed through a micro-channel can be determined at a time, and associated data can be obtained.
Public/Granted literature
- US20100110177A1 PARTICLE MEASURING DEVICE AND PARTICLE SIZE MEASURE DEVICE Public/Granted day:2010-05-06
Information query
IPC分类:
