Invention Grant
- Patent Title: Verification process for non-volatile storage
- Patent Title (中): 非易失性存储的验证过程
-
Application No.: US13154810Application Date: 2011-06-07
-
Publication No.: US08218367B2Publication Date: 2012-07-10
- Inventor: Gerrit Jan Hemink , Shih-Chung Lee , Toru Miwa , Yupin Fong , Jun Wan , Ken Oowada
- Applicant: Gerrit Jan Hemink , Shih-Chung Lee , Toru Miwa , Yupin Fong , Jun Wan , Ken Oowada
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus & DeNiro LLP
- Main IPC: G11C16/06
- IPC: G11C16/06

Abstract:
When erasing non-volatile storage, a verification process is used between erase operations to determine whether the non-volatile storage has been successfully erased. The verification process includes separately performing verification for different subsets of the non-volatile storage elements.
Public/Granted literature
- US20110235423A1 VERIFICATION PROCESS FOR NON-VOLATILE STORAGE Public/Granted day:2011-09-29
Information query