An optical information medium measurement method, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring a modulation degree of each layer of the optical information medium, and a second step of obtaining a thickness between layers of the optical information medium. Further, the method includes a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, as measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, as obtained in the third step.