Invention Grant
- Patent Title: Testing method for bus parameters
- Patent Title (中): 总线参数测试方法
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Application No.: US12261021Application Date: 2008-10-29
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Publication No.: US08219338B2Publication Date: 2012-07-10
- Inventor: Wang-Ding Su , Yung-Cheng Hung , Hsien-Chuan Liang , Po-Kai Huang , Mi-Wen Tsai , Chi-Ren Kuo
- Applicant: Wang-Ding Su , Yung-Cheng Hung , Hsien-Chuan Liang , Po-Kai Huang , Mi-Wen Tsai , Chi-Ren Kuo
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200810304520 20080916
- Main IPC: G01R13/02
- IPC: G01R13/02 ; G01R13/00 ; G06F11/00

Abstract:
A testing system for bus parameters includes a wave displaying unit and a control module connected to the wave displaying unit. The control module includes a decode unit, a testing unit connected to the decode unit, and an output unit connected to the testing unit. The decode unit is connected to the wave displaying unit. The wave displaying unit is configured for receiving an electronic signal from a bus to be tested. The decode unit is configured for decoding the electronic signal to determine if the electronic signal is valid. The testing unit tests parameters of the bus. The output unit displays testing results for the parameters.
Public/Granted literature
- US20100070223A1 TESTING SYSTEM AND METHOD FOR BUS PARAMETERS Public/Granted day:2010-03-18
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