Invention Grant
- Patent Title: High resolution time measurement in a FPGA
- Patent Title (中): FPGA中的高分辨率时间测量
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Application No.: US13162222Application Date: 2011-06-16
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Publication No.: US08219346B2Publication Date: 2012-07-10
- Inventor: Thomas Zurbuchen , Steven Rogacki
- Applicant: Thomas Zurbuchen , Steven Rogacki
- Applicant Address: US MI Ann Arbor
- Assignee: The Regents of the University of Michigan
- Current Assignee: The Regents of the University of Michigan
- Current Assignee Address: US MI Ann Arbor
- Agency: Marshall, Gerstein & Borun LLP
- Main IPC: H03K19/00
- IPC: H03K19/00 ; G06F11/26

Abstract:
Various techniques are described for high resolution time measurement using a programmable device, such as a field programmable gate array (FPGA). The timing may be triggered by any event, depending on the applications of use. Once triggering has occurred, a START pulse begins propagating through the FPGA. The pulse is able to propagate through the FPGA in a staggered manner traversing multiple FPGA columns to maximize the amount of time delay that may be achieved while minimizing the overall array size, and thus minimizing the resource utilization, of the FPGA. The FPGA timing delay is calibrated by measuring for the linear and non-linear differences in delay time of each unit circuit forming the staggered delay line path for the timing circuit. The FPGA is able to achieve nanosecond and sub-nanosecond time resolutions.
Public/Granted literature
- US20110255380A1 High Resolution Time Measurement in a FPGA Public/Granted day:2011-10-20
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