Invention Grant
- Patent Title: Method of estimating information on projection conditions by a projection machine and a device thereof
- Patent Title (中): 通过投影机及其装置估计投影条件的信息的方法
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Application No.: US12086762Application Date: 2006-12-20
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Publication No.: US08219367B2Publication Date: 2012-07-10
- Inventor: Kyoichi Iwata , Hiroyasu Makino
- Applicant: Kyoichi Iwata , Hiroyasu Makino
- Applicant Address: JP Aichi
- Assignee: Sintokogio, Ltd.
- Current Assignee: Sintokogio, Ltd.
- Current Assignee Address: JP Aichi
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2005-365657 20051220; JP2006-009624 20060118; JP2006-054444 20060301
- International Application: PCT/JP2006/325387 WO 20061220
- International Announcement: WO2007/072863 WO 20070628
- Main IPC: G06G7/48
- IPC: G06G7/48

Abstract:
A method of estimating information on the projection states of projection elements (P) by using an analysis model in which discharged projection elements (P) repeatedly collided with rotation blades (13) in a projection machine having rotating blades (13). The method includes the steps of determining initial conditions including information on the size and rotation of blades (13), discharging information on the projection elements(P), and information on projection elements with respect to the blades (13) the step of storing the initial conditions, a computing step of computing the position of each projection element (P), and its velocity and direction after collision with a blade(13) based on the initial conditions, and the step of estimating information on projection state based on computation results.
Public/Granted literature
- US20090222244A1 Method of Estimating information on projection conditions by a projection machine and a device thereof Public/Granted day:2009-09-03
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