Invention Grant
US08219573B2 Test case generation apparatus, generation method therefor, and program storage medium
有权
测试用例生成装置及其生成方法以及程序存储介质
- Patent Title: Test case generation apparatus, generation method therefor, and program storage medium
- Patent Title (中): 测试用例生成装置及其生成方法以及程序存储介质
-
Application No.: US12397602Application Date: 2009-03-04
-
Publication No.: US08219573B2Publication Date: 2012-07-10
- Inventor: Hiromasa Shin
- Applicant: Hiromasa Shin
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Turocy & Watson, LLP
- Priority: JP2008-117173 20080428
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
A method of the present invention includes: inputting a state transition diagram that represents first transitions between a plurality of states; inputting a mapping function that maps a given state to a value within a certain range; mapping each of the states with the mapping function to obtain mapping values, and perform grouping of the states into a plurality of groups based on the mapping values; for each of pairs of two groups obtained by combining two of the groups, setting a second transition from one group of the two groups to the other group when there is at least one first transition between therein; generating a representative transition path which is a sequence of the second transitions by tracing sequentially the second transitions; converting the representative transition path to a transition path in the state transition diagram; outputting the transition path as the test case.
Public/Granted literature
- US20090271139A1 TEST CASE GENERATION APPARATUS, GENERATION METHOD THEREFOR, AND PROGRAM STORAGE MEDIUM Public/Granted day:2009-10-29
Information query