Invention Grant
- Patent Title: Combined single error correction/device kill detection code
- Patent Title (中): 组合单错误纠正/设备杀死检测码
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Application No.: US13246736Application Date: 2011-09-27
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Publication No.: US08219880B2Publication Date: 2012-07-10
- Inventor: Brian P. Lilly , Robert Gries , Sridhar P. Subramanian , Sukalpa Biswas , Hao Chen
- Applicant: Brian P. Lilly , Robert Gries , Sridhar P. Subramanian , Sukalpa Biswas , Hao Chen
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Lawrence J. Merkel
- Main IPC: H03M13/00
- IPC: H03M13/00

Abstract:
In one embodiment, an apparatus includes a check/correct circuit coupled to a control circuit. The check/correct circuit is coupled to receive a block of data and corresponding check bits. The block of data is received as N transmissions, each transmission including M data bits and L check bits. The check/correct circuit is configured to detect one or more errors in each of a plurality of non-overlapping windows of K bits in the M data bits, responsive to the M data bits and the L check bits. The control circuit is configured to record which of the plurality of windows have had errors detected and, if a given window of the plurality of windows has had errors detected in each of the N transmissions of the block, the control circuit is configured to signal a device failure. Each of K, L, M, and N are integers greater than one.
Public/Granted literature
- US20120017135A1 Combined Single Error Correction/Device Kill Detection Code Public/Granted day:2012-01-19
Information query
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