Invention Grant
- Patent Title: Method for analyzing metal specimen
- Patent Title (中): 金属试样分析方法
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Application No.: US12666652Application Date: 2008-06-26
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Publication No.: US08222038B2Publication Date: 2012-07-17
- Inventor: Satoshi Kinoshiro , Tomoharu Ishida
- Applicant: Satoshi Kinoshiro , Tomoharu Ishida
- Applicant Address: JP
- Assignee: JFE Steel Corporation
- Current Assignee: JFE Steel Corporation
- Current Assignee Address: JP
- Agency: DLA Piper LLP (US)
- Priority: JP2007-171713 20070629; JP2008-162651 20080623
- International Application: PCT/JP2008/062037 WO 20080626
- International Announcement: WO2009/005112 WO 20090108
- Main IPC: G01N27/26
- IPC: G01N27/26 ; G01N33/20

Abstract:
A method for analyzing a metal specimen includes an electrolysis step of electrolyzing a metal specimen containing a reference element and a target element in an electrolytic solution, a sampling step of sampling a portion of the electrolytic solution, an analysis step of analyzing the sampled electrolytic solution, a concentration ratio-calculating step of calculating the concentration ratio of the target element to the reference element in the electrolytic solution on the basis of the analysis results, and a content-calculating step of calculating the content of the target element present in the form of a solid solution by multiplying the content of the reference element in the metal specimen by the obtained concentration ratio.
Public/Granted literature
- US20100291692A1 METHOD FOR ANALYZING METAL SPECIMEN Public/Granted day:2010-11-18
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