Invention Grant
- Patent Title: High voltage device
- Patent Title (中): 高压设备
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Application No.: US12500620Application Date: 2009-07-10
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Publication No.: US08222130B2Publication Date: 2012-07-17
- Inventor: Guowei Zhang , Purakh Raj Verma
- Applicant: Guowei Zhang , Purakh Raj Verma
- Applicant Address: SG Singapore
- Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Horizon IP Pte Ltd
- Main IPC: H01L21/22
- IPC: H01L21/22

Abstract:
A method of forming a device is presented. The method includes providing a substrate prepared with an active device region. The active device region includes gate stack layers of a gate stack including at least a gate electrode layer over a gate dielectric layer. A first mask is provided on the substrate corresponding to the gate. The substrate is patterned to at least remove portions of a top gate stack layer unprotected by the first mask. A second mask is also provided on the substrate with an opening exposing a portion of the first mask and the top gate stack layer. A channel well is formed by implanting ions through the opening and gate stack layers into the substrate.
Public/Granted literature
- US20100213543A1 HIGH VOLTAGE DEVICE Public/Granted day:2010-08-26
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