Invention Grant
- Patent Title: ADC calibration
- Patent Title (中): ADC校准
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Application No.: US12844150Application Date: 2010-07-27
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Publication No.: US08223047B2Publication Date: 2012-07-17
- Inventor: Fang-Shi Jordan Lai , Kuo-Ming Wang , Hsu-Feng Hsueh , Cheng Yen Weng , Yung-Fu Lin
- Applicant: Fang-Shi Jordan Lai , Kuo-Ming Wang , Hsu-Feng Hsueh , Cheng Yen Weng , Yung-Fu Lin
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman Ham & Berner, LLP
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
An analog to digital convertor (ADC) includes a plurality of comparators one of which is referred to as an auxiliary comparator (e.g., comparator “Aux”). This comparator Aux is calibrated in the background while other comparators function as usual. Once having been calibrated, the comparator Aux replaces a first comparator, which becomes a new comparator Aux, is calibrated, and replaces the second comparator. This second comparator becomes the new comparator Aux, is calibrated, and replaces the third comparator, etc., until all comparators are calibrated. In effect, at any one point in time, a comparator may be calibrated as desire while other comparators and thus the ADC are operating as usual.
Public/Granted literature
- US20110037632A1 ADC CALIBRATION Public/Granted day:2011-02-17
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