Invention Grant
US08223048B2 Method and apparatus for self-testing a digital-to-analog converter (DAC) in an integrated circuit
有权
用于在集成电路中自我测试数模转换器（DAC）的方法和装置
- Patent Title: Method and apparatus for self-testing a digital-to-analog converter (DAC) in an integrated circuit
- Patent Title (中): 用于在集成电路中自我测试数模转换器（DAC）的方法和装置
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Application No.: US12912446Application Date: 2010-10-26
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Publication No.: US08223048B2Publication Date: 2012-07-17
- Inventor: Jeffrey B. Wilhite
- Applicant: Jeffrey B. Wilhite
- Applicant Address: US IL Schaumburg
- Assignee: Motorola Solutions, Inc.
- Current Assignee: Motorola Solutions, Inc.
- Current Assignee Address: US IL Schaumburg
- Agent Barbara R. Doutre
- Main IPC: H03M1/10
- IPC: H03M1/10
Abstract:
An on-chip self testing digital-to-analog converter (DAC) is provided. The functionality of the DAC is measured using a combination of integral non-linearity (INL) and differential non-linearity (DNL). Parts may pass or be rejected based on the testing. When a DAC passes the testing, the process continues to the next DAC or quits if all the DACs have been tested.
Public/Granted literature
- US20120098687A1 METHOD AND APPARATUS FOR SELF-TESTING A DIGITAL-TO-ANALOG CONVERTER (DAC) IN AN INTEGRATED CIRCUIT Public/Granted day:2012-04-26
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