Invention Grant
- Patent Title: Testing device and testing method employing the same
- Patent Title (中): 测试装置和采用相同的测试方法
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Application No.: US12784588Application Date: 2010-05-21
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Publication No.: US08223324B2Publication Date: 2012-07-17
- Inventor: Chia-Lung Hsu
- Applicant: Chia-Lung Hsu
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Chi Mei Communications Systems, Inc.
- Current Assignee: Chi Mei Communications Systems, Inc.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: TW99109803A 20100331
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01J1/00

Abstract:
An exemplary testing device for testing quality of indicator lights includes a light intensity tester and a control unit electrically connected to the light intensity tester. The light intensity tester includes a testing circuit, and the testing circuit is capable of generating testing parameters of corresponding indicator lights. The control unit is capable of providing electric energy to the indicator lights. The testing parameters from the testing circuit are changed according to light intensity of the indicator lights and are then transmitted to the control unit. Thus, the control unit is capable of comparing the testing parameters with predetermined parameters to detect the quality of the indicator lights.
Public/Granted literature
- US20110241691A1 TESTING DEVICE AND TESTING METHOD EMPLOYING THE SAME Public/Granted day:2011-10-06
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