Invention Grant
- Patent Title: System for alignment measurement for rolling embossed double-sided optical film and method thereof
- Patent Title (中): 压花双面光学薄膜校准测量系统及其方法
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Application No.: US12571961Application Date: 2009-10-01
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Publication No.: US08223335B2Publication Date: 2012-07-17
- Inventor: Shu-Ping Dong , Hung-Ming Tai , Fu-Shiang Yang
- Applicant: Shu-Ping Dong , Hung-Ming Tai , Fu-Shiang Yang
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Morris Manning & Martin LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: TW97147100A 20081204
- Main IPC: G01B11/00
- IPC: G01B11/00

Abstract:
A system for alignment measurement for a rolling embossed double-sided optical film, the system comprising: a first roller with a first brightness enhancement film pattern and a first alignment pattern thereon, a second roller with a second brightness enhancement film pattern and a second alignment pattern thereon; a measuring unit for measuring diffraction patterns in the first alignment region and the second alignment region, respectively; and a control unit electrically connected to the first roller, the second roller and the measuring unit to adjust the relative position between the first roller and the second roller according to the diffraction patterns measured by the measuring unit.
Public/Granted literature
- US20100140312A1 System For Alignment Measurement For Rolling Embossed Double-Sided Optical Film And Method Thereof Public/Granted day:2010-06-10
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