Invention Grant
- Patent Title: State machine sensing of memory cells
- Patent Title (中): 状态机检测存储单元
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Application No.: US13011990Application Date: 2011-01-24
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Publication No.: US08223537B2Publication Date: 2012-07-17
- Inventor: Yantao Ma , Jun Liu
- Applicant: Yantao Ma , Jun Liu
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
The present disclosure includes methods, devices, modules, and systems for sensing memory cells using a state machine. One method embodiment includes generating a first sensing reference according to a first output of a state machine. The method includes bifurcating a range of possible programmed levels to which a memory cell can be programmed with the first sensing reference. The method also includes generating a second sensing reference according to a second output of the state machine. The method further includes determining a programmed level of the memory cell with the second generated sensing reference.
Public/Granted literature
- US20110116301A1 STATE MACHINE SENSING OF MEMORY CELLS Public/Granted day:2011-05-19
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