Invention Grant
- Patent Title: Three-dimensional measuring device
- Patent Title (中): 三维测量装置
-
Application No.: US12688552Application Date: 2010-01-15
-
Publication No.: US08224070B2Publication Date: 2012-07-17
- Inventor: Nobuyuki Umemura , Hiroyuki Ishigaki
- Applicant: Nobuyuki Umemura , Hiroyuki Ishigaki
- Applicant Address: JP Komaki-shi
- Assignee: CKD Corporation
- Current Assignee: CKD Corporation
- Current Assignee Address: JP Komaki-shi
- Agency: Osha Liang LLP
- Priority: JP2009-10076 20090120
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/66

Abstract:
A three-dimensional measuring device includes an irradiation device configured to irradiate and switch among a multiplicity of light patterns having different periods and having a striped light intensity distribution on at least a measurement object, a camera having an imaging element capable of imaging reflected light from the measurement object irradiated by the light pattern, a rack configured to cause relative change in positional relationship between the imaging element and the measurement object, and a control device configured to perform three-dimensional measurements based on image data imaged by the camera. The control device performs the three-dimensional measurements by performing a phase shift method calculation of height data as a first height data for each pixel unit of image data based on a multiply phase-shifted image data obtained by irradiating on a first position a multiply phase-shifted first light pattern having a first period.
Public/Granted literature
- US20100183194A1 THREE-DIMENSIONAL MEASURING DEVICE Public/Granted day:2010-07-22
Information query