Invention Grant
- Patent Title: Apparatus and method for monitoring an industrial process
- Patent Title (中): 用于监测工业过程的装置和方法
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Application No.: US12693830Application Date: 2010-01-26
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Publication No.: US08224473B2Publication Date: 2012-07-17
- Inventor: Sankar Selvaraj , Joseph Ching Hua Lee , Sreenivas Yelneedi
- Applicant: Sankar Selvaraj , Joseph Ching Hua Lee , Sreenivas Yelneedi
- Applicant Address: JP Musashino-shi, Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Musashino-shi, Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: SG200903088-3 20090505
- Main IPC: G06F11/30
- IPC: G06F11/30

Abstract:
An apparatus for monitoring an industrial process comprising a plurality of variables. The apparatus comprises a defining module configured for defining a normal-condition data set may comprise data values of the variables when the industrial process is operating under a normal condition and for defining an abnormal-condition data set may comprise data values of the variables when the industrial process is operating under an abnormal condition; a modelling module configured for modelling a normal-condition model from the normal-condition data set and modelling an abnormal-condition model from the abnormal-condition data set; a plotting module configured for plotting a normal-condition plot from the normal-condition model and plotting an abnormal-condition plot from the abnormal-condition model; and an analysis module configured for analysing live data values of the variables for simultaneous display with the normal-condition plot and the abnormal-condition plot.
Public/Granted literature
- US20100286969A1 APPARATUS AND METHOD FOR MONITORING AN INDUSTRIAL PROCESS Public/Granted day:2010-11-11
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