Invention Grant
- Patent Title: Measuring clock jitter
- Patent Title (中): 测量时钟抖动
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Application No.: US11569804Application Date: 2005-06-02
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Publication No.: US08224606B2Publication Date: 2012-07-17
- Inventor: Adam Leitch
- Applicant: Adam Leitch
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: GB0412451.7 20040604
- International Application: PCT/IB2005/051795 WO 20050602
- International Announcement: WO2005/119379 WO 20051215
- Main IPC: G01R25/04
- IPC: G01R25/04

Abstract:
A device and method corrects time data based on a clock signal affected by jitter. The error due to jitter in a time measurement of an event in the clock signal is determined at the time of the event or as an average over a number of events. A measurement is made of a time dependent reference variable associated with a long-time constant device, such as a capacitor, which is relatively immune to localized jitter. The measurement may be a reading of the voltage across a charging capacitor. The measured value is compared to an expected value, and the time error is based on the result. The expected value may be stored or calculated from known charging rates of the capacitor. The error due to jitter of a time measurement is approximately linearly proportional to the difference in voltage between the measured and the expected values of the capacitor.
Public/Granted literature
- US20090198467A1 Measuring Clock Jitter Public/Granted day:2009-08-06
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