Invention Grant
US08224607B2 Method and apparatus for robot calibrations with a calibrating device
有权
用于校准装置的机器人校准的方法和装置
- Patent Title: Method and apparatus for robot calibrations with a calibrating device
- Patent Title (中): 用于校准装置的机器人校准的方法和装置
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Application No.: US12198076Application Date: 2008-08-25
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Publication No.: US08224607B2Publication Date: 2012-07-17
- Inventor: Vijay Sakhare , Sekar Krishnasamy , Mordechai Leska , Donald Foldenauer , Rinat Shimshi , Marvin L. Freeman , Jeffery Hudgens , Satish Sundar
- Applicant: Vijay Sakhare , Sekar Krishnasamy , Mordechai Leska , Donald Foldenauer , Rinat Shimshi , Marvin L. Freeman , Jeffery Hudgens , Satish Sundar
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G01C17/38
- IPC: G01C17/38

Abstract:
Described herein is a method and apparatus for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes moving the calibrating device across a target (e.g., a wafer chuck). Next, the method includes measuring distances between light spots from the sensors and a perimeter of the target using the sensors located on the calibrating device. Next, the method includes determining a displacement of the calibrating device relative to a center of the target. Then, the method includes determining a rotation angle of the calibrating device relative to a system of coordinates of the target. Next, the method includes calibrating a robot position of the robot based on the displacement and rotation angle of the calibrating device with respect to the target.
Public/Granted literature
- US20090062959A1 METHOD AND APPARATUS FOR ROBOT CALIBRATIONS WITH A CALIBRATING DEVICE Public/Granted day:2009-03-05
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