Invention Grant
- Patent Title: Self-testing device component
- Patent Title (中): 自检设备组件
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Application No.: US12448286Application Date: 2006-12-18
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Publication No.: US08224612B2Publication Date: 2012-07-17
- Inventor: Kouroush Mohebbi , Brian David Baehl
- Applicant: Kouroush Mohebbi , Brian David Baehl
- Applicant Address: FR Boulogne-Billancourt
- Assignee: Thomson Licensing
- Current Assignee: Thomson Licensing
- Current Assignee Address: FR Boulogne-Billancourt
- Agent Robert D. Shedd; Harvey D. Fried; Richard LaPeruta
- International Application: PCT/US2006/048004 WO 20061218
- International Announcement: WO2008/076100 WO 20080626
- Main IPC: G01R27/28
- IPC: G01R27/28
Abstract:
A device has a microcontroller (102) configured to operate in a fully-assembled mode if a device component (100) of the device is connected to a primary portion of the device when power is applied to the device component and configured to operate in a self-test mode if the device component is not connected to the primary portion of the device when power is applied to the device component.
Public/Granted literature
- US20090281757A1 Self-testing device component Public/Granted day:2009-11-12
Information query
