Invention Grant
- Patent Title: Method to determine a quality acceptance criterion using force signatures
- Patent Title (中): 使用强制签名确定质量验收标准的方法
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Application No.: US12757119Application Date: 2010-04-09
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Publication No.: US08224623B2Publication Date: 2012-07-17
- Inventor: Jeffrey M. Handel , Robert W. Caven
- Applicant: Jeffrey M. Handel , Robert W. Caven
- Applicant Address: US MI Troy
- Assignee: Delphi Technologies, Inc.
- Current Assignee: Delphi Technologies, Inc.
- Current Assignee Address: US MI Troy
- Agent Paul W. Thiede
- Main IPC: G06F17/18
- IPC: G06F17/18

Abstract:
A method is provided to determine a quality acceptance criterion using force signatures measured on a first and a second set of elements. The first set has no quality defect and the second set has a deliberate quality defect. Selection of an initial subset of time points is based on statistical analysis of the force data on the force signatures in the two sets. The quality acceptance criterion includes a quality threshold established using Mahalanobis Distance (MD) values and the MD values are produced from force data at a selected initial subset of time points for each element in the two sets. An output of the determined quality acceptance criterion is using the defined quality threshold to separate an element having a force signature into a group of elements having no quality defect or into a group of elements having a quality defect like the deliberate quality defect.
Public/Granted literature
- US20110251811A1 METHOD TO DETERMINE A QUALITY ACCEPTANCE CRITERION USING FORCE SIGNATURES Public/Granted day:2011-10-13
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