Invention Grant
- Patent Title: Quality degradation point estimating system and quality degradation point estimating method
- Patent Title (中): 质量劣化点估算系统和质量劣化点估算方法
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Application No.: US11993155Application Date: 2006-06-20
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Publication No.: US08224626B2Publication Date: 2012-07-17
- Inventor: Yohei Hasegawa , Masayoshi Kobayashi
- Applicant: Yohei Hasegawa , Masayoshi Kobayashi
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2005-184342 20050624
- International Application: PCT/JP2006/312276 WO 20060620
- International Announcement: WO2006/137373 WO 20061228
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G21C17/00

Abstract:
A quality degradation point estimating method for estimating a quality degradation point in a directed link set through which a communication flow passed is provided. The quality degradation point estimating method has: (A) determining a test flow set for estimating a quality degradation point; and (B) estimating the quality degradation point in the directed link set by sending the test flow set to the network. The (A) step includes a step of setting the flow, which passes through a partial set as a part of the directed link set, as the test flow and adding the set test flow to the test flow set. The test flow is sent from the test terminal on the network to a predetermined node in the partial set. A response is obtained at the predetermined node, and the response is sent from the predetermined node to a predetermined terminal.
Public/Granted literature
- US20100049460A1 QUALITY DEGRADATION POINT ESTIMATING SYSTEM AND QUALITY DEGRADATION POINT ESTIMATING METHOD Public/Granted day:2010-02-25
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