Invention Grant
US08225152B2 Method and apparatus for generating electronic test and data structure
有权
用于生成电子测试和数据结构的方法和装置
- Patent Title: Method and apparatus for generating electronic test and data structure
- Patent Title (中): 用于生成电子测试和数据结构的方法和装置
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Application No.: US10141719Application Date: 2002-05-09
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Publication No.: US08225152B2Publication Date: 2012-07-17
- Inventor: Christopher K Sutton
- Applicant: Christopher K Sutton
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A hierarchical test executive system comprising and including Procedure, Test, Measurement and Datapoint levels. A Procedure is an ordered list of Tests; a Test is a group of Measurements in a Procedure that share the same test algorithm, and thus the same software code; a Measurement is a configuration or setup for a Test, and provides parameters to a Test; and a Datapoint is a subset of a Measurement containing additional parameters that select a result when one Measurement generates multiple results. When initiated, the test executive system presents a list of models and the user selects a model to be tested. The program then uploads the test software corresponding to the selected model and presents a list and descriptions of Procedures to the user. The user selects one of the Procedures, and the program retrieves the selected procedure from the test software and expands it into Tests, Measurements and Datapoints as determined by the Procedure. The test executive system then loops through the Tests, Measurements and Datapoints, generating the results and a corresponding data structure on the fly.
Public/Granted literature
- US20030212938A1 Method and apparatus for generating electronic test and data structure Public/Granted day:2003-11-13
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