Invention Grant
US08225171B2 Semiconductor memory device having an error correction function and associated method
有权
具有误差校正功能和相关方法的半导体存储器件
- Patent Title: Semiconductor memory device having an error correction function and associated method
- Patent Title (中): 具有误差校正功能和相关方法的半导体存储器件
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Application No.: US12071024Application Date: 2008-02-14
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Publication No.: US08225171B2Publication Date: 2012-07-17
- Inventor: Bok-Gue Park
- Applicant: Bok-Gue Park
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2007-0016584 20070216
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A semiconductor memory device may include a parity generating circuit, a memory cell array, an error calculating circuit and an error corrector. The parity generating circuit generates parities having different number of bits according to types of a partial array self-refresh mode, and selects one of the parities to output a first parity. The error calculating circuit calculates an error based on a first data corresponding to the input data and a second parity corresponding to the first parity and outputs a first error data. The error corrector corrects the first data based on the first data and the first error data.
Public/Granted literature
- US20080294934A1 Semiconductor memory device having an error correction function and associated method Public/Granted day:2008-11-27
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