Invention Grant
US08225171B2 Semiconductor memory device having an error correction function and associated method 有权
具有误差校正功能和相关方法的半导体存储器件

  • Patent Title: Semiconductor memory device having an error correction function and associated method
  • Patent Title (中): 具有误差校正功能和相关方法的半导体存储器件
  • Application No.: US12071024
    Application Date: 2008-02-14
  • Publication No.: US08225171B2
    Publication Date: 2012-07-17
  • Inventor: Bok-Gue Park
  • Applicant: Bok-Gue Park
  • Applicant Address: KR Suwon-si, Gyeonggi-do
  • Assignee: Samsung Electronics Co., Ltd.
  • Current Assignee: Samsung Electronics Co., Ltd.
  • Current Assignee Address: KR Suwon-si, Gyeonggi-do
  • Agency: Lee & Morse, P.C.
  • Priority: KR10-2007-0016584 20070216
  • Main IPC: G06F11/00
  • IPC: G06F11/00
Semiconductor memory device having an error correction function and associated method
Abstract:
A semiconductor memory device may include a parity generating circuit, a memory cell array, an error calculating circuit and an error corrector. The parity generating circuit generates parities having different number of bits according to types of a partial array self-refresh mode, and selects one of the parities to output a first parity. The error calculating circuit calculates an error based on a first data corresponding to the input data and a second parity corresponding to the first parity and outputs a first error data. The error corrector corrects the first data based on the first data and the first error data.
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