Invention Grant
US08225244B2 Large scale integration device and large scale integration design method including both a normal system and diagnostic system 失效
大规模集成设备和大规模集成设计方法,包括正常系统和诊断系统

  • Patent Title: Large scale integration device and large scale integration design method including both a normal system and diagnostic system
  • Patent Title (中): 大规模集成设备和大规模集成设计方法,包括正常系统和诊断系统
  • Application No.: US12303638
    Application Date: 2008-11-06
  • Publication No.: US08225244B2
    Publication Date: 2012-07-17
  • Inventor: Shuntaro Seno
  • Applicant: Shuntaro Seno
  • Applicant Address: JP Tokyo
  • Assignee: Hitachi, Ltd.
  • Current Assignee: Hitachi, Ltd.
  • Current Assignee Address: JP Tokyo
  • Agency: Antonelli, Terry, Stout & Kraus, LLP.
  • International Application: PCT/JP2008/003218 WO 20081106
  • International Announcement: WO2010/052754 WO 20100514
  • Main IPC: G06F17/50
  • IPC: G06F17/50 G01R31/28
Large scale integration device and large scale integration design method including both a normal system and diagnostic system
Abstract:
The LSI design apparatus adds diagnostic circuitry for micro diagnosis to a behavior level description. Based on behavior level design data for a normal system of a LSI, high level synthesis generates RTL design data and register information. Based on the register information, a unique address used by a micro diagnosis program is allocated to each register. Circuit components within the normal system are grouped together. Based on the result of the address allocation and the result of the grouping, a behavior description for diagnostic circuits constituting a diagnosis system for the LSI is generated and added to the behavior level design data for the normal system, resulting in behavior level design data in which the normal and diagnosis systems are integrated together.
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