Invention Grant
- Patent Title: Method for testing a system
- Patent Title (中): 系统测试方法
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Application No.: US11717271Application Date: 2007-03-13
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Publication No.: US08225287B2Publication Date: 2012-07-17
- Inventor: Lewis S. Bruck , Ranjani Ramamurthy , Tao Di , Shriram Lakshmi
- Applicant: Lewis S. Bruck , Ranjani Ramamurthy , Tao Di , Shriram Lakshmi
- Applicant Address: US WA Redmond
- Assignee: Microsoft Corporation
- Current Assignee: Microsoft Corporation
- Current Assignee Address: US WA Redmond
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
In a method for testing a system, the technology initially accesses a database having a plurality of stand-alone pieces-of-code. Each piece-of-code includes a sequence of operations to be performed on a system. One or more of a plurality of stand-alone pieces-of-code within a database are selected to generate a set of at least two stand-alone pieces-of-code, based on a testing scenario. A variable test sequence from a set of at least two stand-alone pieces-of-code is then generated. The variable test sequence is then utilized to test a system based on a testing scenario.
Public/Granted literature
- US20080228805A1 Method for testing a system Public/Granted day:2008-09-18
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