Invention Grant
- Patent Title: Method for processing output of scanning type probe microscope, and scanning type probe microscope
- Patent Title (中): 扫描型探针显微镜输出处理方法及扫描型探针显微镜
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Application No.: US13133595Application Date: 2009-12-07
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Publication No.: US08225418B2Publication Date: 2012-07-17
- Inventor: Eika Tsunemi , Nobuo Satoh , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
- Applicant: Eika Tsunemi , Nobuo Satoh , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
- Applicant Address: JP Kyoto-shi
- Assignee: Kyoto University
- Current Assignee: Kyoto University
- Current Assignee Address: JP Kyoto-shi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2008-314113 20081210
- International Application: PCT/JP2009/006658 WO 20091207
- International Announcement: WO2010/067570 WO 20100617
- Main IPC: G01Q20/02
- IPC: G01Q20/02 ; G01B11/30 ; G01B5/28

Abstract:
Incident light 19 emitted from a laser light source 18 is reflected on an upper surface of a cantilever 13, so that reflected light 19a enters light detection means 20. Since the incident light 19 and the reflected light 19a are in a plane not including a long axis of the cantilever 13, movements of the reflected light 19a due to change in a deflection amount θ of the cantilever 13 and due to change in a fine vertical movement amount z thereof are different in direction on the light detection means 20. This enables the change in the deflection amount θ of the cantilever 13 and the change in the fine vertical movement amount z thereof to be separated from output of the light detection means 20.
Public/Granted literature
- US20110247107A1 METHOD FOR PROCESSING OUTPUT OF SCANNING TYPE PROBE MICROSCOPE, AND SCANNING TYPE PROBE MICROSCOPE Public/Granted day:2011-10-06
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