Invention Grant
US08225418B2 Method for processing output of scanning type probe microscope, and scanning type probe microscope 失效
扫描型探针显微镜输出处理方法及扫描型探针显微镜

Method for processing output of scanning type probe microscope, and scanning type probe microscope
Abstract:
Incident light 19 emitted from a laser light source 18 is reflected on an upper surface of a cantilever 13, so that reflected light 19a enters light detection means 20. Since the incident light 19 and the reflected light 19a are in a plane not including a long axis of the cantilever 13, movements of the reflected light 19a due to change in a deflection amount θ of the cantilever 13 and due to change in a fine vertical movement amount z thereof are different in direction on the light detection means 20. This enables the change in the deflection amount θ of the cantilever 13 and the change in the fine vertical movement amount z thereof to be separated from output of the light detection means 20.
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